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High-precision Measurements of Ionospheric TEC Gradients with the Very Large Array VHF System

机译:高精度电离层TEC梯度的测量   大阵列VHF系统

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摘要

We have used a relatively long, contiguous VHF observation of a bright cosmicradio source (Cygnus A) with the Very Large Array (VLA) to demonstrate thecapability of this instrument to study the ionosphere. This interferometer, andothers like it, can observe ionospheric total electron content (TEC)fluctuations on a much wider range of scales than is possible with many otherinstruments. We have shown that with a bright source, the VLA can measuredifferential TEC values between pairs of antennas (delta-TEC) with an precisionof 0.0003 TECU. Here, we detail the data reduction and processing techniquesused to achieve this level of precision. In addition, we demonstrate techniquesfor exploiting these high-precision delta-TEC measurements to compute the TECgradient observed by the array as well as small-scale fluctuations within theTEC gradient surface. A companion paper details specialized spectral analysistechniques used to characterize the properties of wave-like fluctuations withinthis data.
机译:我们已经使用明亮的宇宙放射源(天鹅座A)和超大型阵列(VLA)进行了相对较长的连续VHF观测,以证明该仪器具有研究电离层的能力。与其他仪器相比,该干涉仪以及其他类似仪器可以观察到电离层总电子含量(TEC)的变化幅度。我们已经表明,使用亮光源,VLA可以以0.0003 TECU的精度测量天线对之间的差分TEC值(δ-TEC)。在这里,我们详细介绍了用于达到此精度水平的数据缩减和处理技术。此外,我们演示了利用这些高精度delta-TEC测量值来计算阵列观察到的TEC梯度以及TEC梯度表面内小范围波动的技术。随附的论文详细介绍了专门的光谱分析技术,这些技术用于表征此数据中的波状起伏特性。

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